Photoreflectance (PR) spectra have been measured to determine the lowest direct-band edge E0α (α=A, B, and C) of wurtzite CdS single crystal in the temperature range T=13–300 K for both E⊥c and E∥c polarizations. The measured PR spectra can be interpreted by the three-dimensional (3D) excitonic plus one-electron line shapes over the entire temperature range. The temperature dependence of the excitonic and critical-point parameters (energy, amplitude, and broadening parameter) have been determined and analyzed using the Varshni [Physica (Amsterdam) 34, 149 (1967)] equation and an analytical four-parameter expression recently developed for the explanation of the band-gap shrinkage effect in semiconductors. The 3D- exciton binding energies have also been determined to be 27 (A), 31 (B), and 30 meV (C), respectively.

TlInGaAs quaternary alloy layers were grown on InP substrates by gas-source molecular-beam epitaxy. Refractive index dispersions were determined at the temperature range of 300–340 K in the photon-energy region below and a little above the direct bandedge E0 by the optical reflectance measurements. The temperature dependence of the refractive index was analyzed with the first-order Sellmeier equation. The temperature dependence of the E0 edge was also determined by the absorption measurements. It was found that the temperature coefficients of both refractive index and E0 edge of TlInGaAs are much smaller than those for InGaAs. These results facilitate the fabrication of the temperature-stable-wavelength optoelectronic devices using this alloy system.

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Refractive-index dispersion for the TlInGaAs quaternary alloys, grown on (100) InP substrates by gas-source molecular-beam epitaxy, has been measured at temperatures from 290 to 350 K in the photon-energy range of 1.2–2.0 eV by using spectroscopic ellipsometry. The temperature coefficient of the refractive-index decreases with increasing Tl composition. The result corresponds to the already reported reduced temperature dependence of the band-gap energy for the TlInGaAs because of the alloy of semiconductor InGaAs and semimetal TlAs. The result also agrees with the recently reported small temperature-variation of the lasing-wavelength for the TlInGaAs/InP laser diodes.

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