The effect of hypochlorite treatment on the layer thickness and conductivity of a state-of-the-art high conducting poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) is investigated as a function of exposure time and hypochlorite concentration. Because of overoxidation by the hypochlorite the PEDOT:PSS conductivity is decreased by 10 orders of magnitude. Comparison of thickness and conductivity as a function of time shows that a residual insulating layer remains on the substrate upon treatment. Going from a low (<0.01%) to a high (>0.1%) hypochlorite concentration the interaction between PEDOT:PSS and hypochlorite changes from reaction- to diffusion limited. The decrease in conductivity can be interpreted in terms of the interruption of percolating conductive pathways by the reaction between PEDOT and hypochlorite.

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Take-down policy If you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim.Downloaded from the University of Groningen/UMCG research database (Pure): http://www.rug.nl/research/portal. For technical reasons the number of authors shown on this cover page is limited to 10 maximum. Charge transport in poly(2-methoxy, 5-(2 0 -ethyl-hexyloxy)-p-phenylene vinylene ) (MEH-PPV)-based hole-on ly diodes is investigated at high electric fields and low temperat ures using a novel diode architecture. Charge carrier densities that are in the range of those in a field-effect transistor are achieved, bridging the gap in the mobility versus charge carrier density plot between polymer-based light-emitting diodes and field-effect transistors. The extended field range that is accessed allows us to discuss the applicability of current theoretical models of charge transport, using numer ical simulations. Finally, within a simple approximation, we extract the hopping length for holes in MEH-PPV directly from the experimental data at high fields, and we derive a value of 1.0 ± 0.1 nm.