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Dependence of AC transport current losses on bending strains of two kinds of YBCO coated conductors (CCs) manufactured by IBAD/MOCVD and IBAD/PLD processes were investigated. The bending strains were applied to CCs samples by mounting the samples on U-shape sample holders consisted of straight and half-cylindrical sections. The bending strains to the superconductor layer were in tensile and compressive directions. The experimental results showed that the bending dependence of the AC transport current loss could be characterized by the amount of the deteriorations of the conductor critical currents dependent on structure changes of the superconductor layers due to the bending strains, regardless of the CCs manufacturing processes and the directions of the strains.

Influence of copper layers on AC transport current losses in copper stabilized YBCO coated conductors subjected to bending strains was investigated. The bending strains were applied to conductor samples by mounting the samples on sample holders consisted of straight and half-cylindrical sections. The directions of the bending were that the copper layer was subjected to tensile strain (the outward bending) or compressive strain (inward bending). The thickness of the copper layer was 100 m. Experimental results showed that there is no apparent influence of copper layer on the AC transport loss characteristics. There were dependences of the losses on the bending strains. However, when the loss characteristics are normalized by the strain dependent critical currents, the losses vs. AC transport characteristics dependent on bending strains can be expressed by one curve in both cases of the outward and inward bendings.

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