In its orginal configuration, the pulsed ultasonic polarscan (P-UPS) mainly focussed on elastic material characterization through the inversion of amplitude landscape measurements. However, for several materials, special attention is required as minima in the transmission amplitudes do not exactly coincide with critical angles calculated from the Christoffel equations. Consequently, other means to extract the information on elastic moduli from P-UPS measurements are being investigated. In the present paper, we report on the use of time-of-flight ultrasonic polarscan (TOF-UPS) simulations as a new means of material characterization. Previous TOF inversions, although successful, were based on bulk wave approximations, which are not longer valid for thin materials. Our first inversion results on numerical cases demonstrate the usefulness of the new developed technique and highlight the added value compared to the bulk wave approximation 1 INTRODUCTION