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Advances in nanotechnology and materials science require further improvement of metrology of nanostructured polymers, in particular, polymers modified by high energy ion beams. The observation of latent ion tracks using various microscopy methods is an important part of studies on heavy ion effects in solids. However, scanning electron microscopy (SEM) has not been utilized for polymers. In the present study, it is shown how SEM can be used to observe latent tracks in semicrystalline polymers. The procedure includes the embrittlement of a polymer specimen by controlled photooxidation and its subsequent fracture. Latent tracks are clearly visible on fractured surfaces as structureless stripes surrounded by an inhomogeneous semicrystalline matrix. Using this method, the latent tracks of Kr, Xe, Au, and Bi ions with energies of 1-11 MeV/u in polyethylene terephthalate and polypropylene films are observed and their diameters are estimated. In contrast to transmission electron microscopy, the suggested novel technique detects the outer track shell consisting of an amorphized polymer. Therefore, SEM observations can complement other commonly used techniques to comprehensively characterize the structure of ion tracks in polymers.

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