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Applying optical techniques, a study is carried out of the etch patterns produced, at room temperature, by diluted hydrofluoric acid and sodium hydroxide solution at 260°C, on partially cleaved rhombohedral cleavages of cultured quartz. Isolated and randomly distributed small pits are observed. The pits nucleated at the dislocations penetrated deeper in the body of the crystal on prolonged etching. Both the faces of cleaved thin flakes of the crystal have been etched in (1) alkali as well as (2) alkali and acid. One-to-one correspondence has been established in the number and positioning of the pits. Correspondence has also been established in the number and positioning of the isolated pits before and after polishing a cleavage. The curl bottomed nature of the pits has been attributed to the screw dislocations. The implications are discussed.