Pure and tellurium-doped ZnO nanostructure films were prepared on microscopic glass substrates using the sol-gel method and investigated the relationship between the structural, morphological, roughness, and optical properties. The X-ray diffraction (XRD) spectra revealed that the nanostructure films have a hexagonal Wurtzite structure. The field emission scanning electron microscope (FESEM) images showed that the surface morphology of the nanostructure films was modified due to the Te dopant. The atomic force microscopy (AFM) technique was used to study the surface roughness of the pure ZnO and Te-doped ZnO deposited films. The optical properties of the nanostructure films were obtained using the ultraviolet-visible spectrophotometer. The effects of Te dopant elements on the optical characteristics and the samples’ energy band gaps were calculated and discussed.

Undoped and Te-doped ZnO nanostructured films were prepared on glass substrates by a sol-gel technique with different atomic concentrations of Te. The deposited films were characterized to investigate the structural, surface, and optical properties. The films are polycrystalline in nature and have a hexagonal structure. The crystal structure of ZnO1 -xTex films was determined, and various crystal parameters such as 2 value, FWHM, crystalline size, lattice strain, and dislocation density were calculated. The surface morphology of the films was tailored, and it was found that as the doping concentration of Te increases in ZnO, a decrease in the grain size is observed. The transmittance spectra of undoped ZnO and Te-doped ZnO films were highly transparent (~ 80 %) in the visible region. The average transparency was increased to increase the Te doping concentration. Transmittance edges were shifted to lower wavelengths when the atomic percentage of Te concentration increased. When the concentration of Te increased, an increase in the optical band gap of the deposited films was observed. Photoluminescence (PL) shows that all nanofilms have strong peaks in the ultraviolet region and small deep-level emission peaks in the visible region, depending on the Te concentration. The PL spectra of Te-doped ZnO shows a large blue shift from 396 to 381 nm in the UV emission peak position. It was also observed that as the Te doping concentration increased, the intensities of the PL bands in the visible range also increased.

The structural, morphological and optical properties of Te-doped ZnO thin films prepared on microscopic glass substrates using the sol-gel technique were investigated. Zinc acetate dihydrate and tellurium tetrachloride as starting precursors, 2-methoxy ethanol as solvent were used to prepare the gel solution. Deposited films were post-annealed at different temperatures and characterized by X-ray Diffraction (XRD), Field Emission Scanning Electron Microscopy (FESEM) and UV-VIS Spectrophotometer for studying structural, surface morphological and optical properties. Energy dispersive analysis by X-ray (EDAX) shows the incorporation of Te content into ZnO. XRD spectrum confirmed that the deposited Te-doped ZnO films are hexagonal. The crystallinity of films was found to be increased with an increase in post-annealing temperature. The optical band gap of Te-doped ZnO annealed films was found to be increased from 3.225 to 3.281 eV. Photoluminescence (PL) intensity of ultraviolet and blue emission measurements of the thin films was obtained in the spectral range from 350 to 600 nm.