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The dependence of power delay profile upon bandwidth (temporal resolution) and center frequency is systematically studied using ultra-wideband measurements. The necessary measurement parameters for wideband channel models construction, validation and construction of precise site-specific propagation prediction models and investigation of propagation mechanisms have been detected. Ray tracing and Finite Integration Technique numerical Maxwell's equation solver accuracy has been estimated and compared on the basis of delay profiles.

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Under Thin-layer Interference Structures (TIS) [1,2] we'll understand antireflection systems with specific optical and structural properties, to the fundamental of which we can attribute the invariance of amplitude characteristics and total optical thickness of the structure on the number of periods and an opportunity of synthesis of such antireflection structures with layers' thicknesses significantly smaller than λ/4.