The effect of electric fields on metal surfaces is fairly well studied, resulting in numerous analytical models developed to understand the mechanisms of ionization of surface atoms observed at very high electric fields, as well as the general behavior of a metal surface in this condition. However, the derivation of analytical models does not include explicitly the structural properties of metals, missing the link between the instantaneous effects owing to the applied field and the consequent response observed in the metal surface as a result of an extended application of an electric field. In the present work, we have developed a concurrent electrodynamicmolecular dynamic model for the dynamical simulation of an electric-field effect and subsequent modification of a metal surface in the framework of an atomistic molecular dynamics (MD) approach. The partial charge induced on the surface atoms by the electric field is assessed by applying the classical Gauss law. The electric forces acting on the partially charged surface atoms (Lorentz and Coulomb) are then introduced in the MD algorithm to correct the atomic motion in response to the applied field. The enhancement factor at sharp features on the surface for the electric field and the assessment of atomic charges are discussed. The results obtained by the present model compare well with the experimental and density-functional theory results. Geneva, SwitzerlandFebruary 2011 CLIC -Note -870PHYSICAL REVIEW E 83, 026704 (2011) The effect of electric fields on metal surfaces is fairly well studied, resulting in numerous analytical models developed to understand the mechanisms of ionization of surface atoms observed at very high electric fields, as well as the general behavior of a metal surface in this condition. However, the derivation of analytical models does not include explicitly the structural properties of metals, missing the link between the instantaneous effects owing to the applied field and the consequent response observed in the metal surface as a result of an extended application of an electric field. In the present work, we have developed a concurrent electrodynamicmolecular dynamic model for the dynamical simulation of an electric-field effect and subsequent modification of a metal surface in the framework of an atomistic molecular dynamics (MD) approach. The partial charge induced on the surface atoms by the electric field is assessed by applying the classical Gauss law. The electric forces acting on the partially charged surface atoms (Lorentz and Coulomb) are then introduced in the MD algorithm to correct the atomic motion in response to the applied field. The enhancement factor at sharp features on the surface for the electric field and the assessment of atomic charges are discussed. The results obtained by the present model compare well with the experimental and density-functional theory results.
We examine a possible mechanism for the formation of protrusions on a metallic surface held in a sufficiently high electric field in the presence of a near-surface void. By means of molecular dynamics simulations we show that the high tensile stress exerted on a Cu f110g surface with a near-surface void can promote the nucleation of dislocations on the void surface. These dislocations cause slip along f111g crystallographic planes leading to mass transport in the volume above the void. We find a linear correlation between the radius of the void and the maximum depth for the growth to occur. V
For constructing physical science based models in irregular numerical grids, an easy-to-implement method for solving partial differential equations has been developed and its accuracy has been evaluated by comparison to analytical solutions that are available for simple initial and boundary conditions. The method is based on approximating the local average gradients of a field by fitting equation of plane to the field quantities at neighbouring grid positions and then calculating an estimate for the local average gradient from the plane equations. The results, comparison to analytical solutions, and accuracy are presented for 2-dimensional cases.
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