Electrochemical electrodes comprise multiple phenomena at different scales. Several works have tried to model such phenomena using statistical techniques. This paper proposes a novel process to work with reduced size images to reconstruct microstructures with the Simulated Annealing method. Later, using the Finite Volume Method, it is verified the effect of the image resolution on the effective transport coefficient (ETC). The method can be applied to synthetic images or images from the Scanning Electron Microscope. The first stage consists of obtaining the image of minimum size, which contains at least 98% of the statistical information of the original image, allowing an equivalent statistical study. The image size reduction was made by applying an iterative decimation over the image using the normalized coarseness to compare the amount of information contained at each step. Representative improvements, especially in processing time, are achieved by reducing the size of the reconstructed microstructures without affecting their statistical behavior. The process ends computing the conduction efficiency from the microstructures. The simulation results, obtained from two kinds of images from different materials, demonstrate the effectivity of the proposed approach. It is important to remark that the controlled decimation allows a reduction of the processor and memory use during the reconstruction and ETC computation of electrodes.