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The three omega thermal conductivity measurement method is analyzed for the case of one or more thin films on a substrate of finite thickness. The analysis is used to obtain the thermal conductivities of SiO2 films on Si substrates and of a chemical vapor deposition (CVD) diamond plate. For the case of the SiO2 films on a Si, we find an apparent thickness dependence of the thermal conductivity of the SiO2 films. However, the data can also be explained by a thickness-independent thermal conductivity and an interfacial thermal resistance. For the case of the CVD diamond plate, the fit of the theory to the experimental data is significantly improved if we assume that an interface layer separates the heater from the diamond plate.

The Stark shift due to blackbody radiation (BBR) is the key factor limiting the performance of many atomic frequency standards, with the BBR environment inside the clock apparatus being difficult to characterize at a high level of precision. Here we demonstrate an in-vacuum radiation shield that furnishes a uniform, well-characterized BBR environment for the atoms in an ytterbium optical lattice clock. Operated at room temperature, this shield enables specification of the BBR environment to a corresponding fractional clock uncertainty contribution of 5.5 × 10 −19 . Combined with uncertainty in the atomic response, the total uncertainty of the BBR Stark shift is now 1×10 −18 . Further operation of the shield at elevated temperatures enables a direct measure of the BBR shift temperature dependence and demonstrates consistency between our evaluated BBR environment and the expected atomic response.

We describe a non-traditional optical power meter which measures radiation pressure to accurately determine a laser's optical power output. This approach traces its calibration of the optical watt to the kilogram. Our power meter is designed for high-accuracy and portability with the capability of multi-kilowatt measurements whose upper power limit is constrained only by the mirror quality. We provide detailed uncertainty evaluation and validate experimentally an average expanded relative uncertainty of 0.016 from 1 kW to 10 kW. Radiation pressure as a power measurement tool is unique to the extent that it does not rely on absorption of the light to produce a high-accuracy result. This permits fast measurements, simplifies power scalability, and allows high-accuracy measurements to be made during use of the laser for other applications.

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