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The spatial resolution and flexibility of the Scanning/Transmission Electron Microscope (S/TEM) as a characterization tool is unmatched. Atomic resolution imaging is quickly becoming an essential component in the characterization workflow. The experimental capabilities of the side-entry S/TEM are also readily augmented by the addition of specialized sample holders, which can subject the sample to various conditions in situ. Holders for the S/TEM can expose samples to heating, cryogenic conditions, gases, liquids, and mechanical strain [1]. Most of these holders are available in stable configurations suitable for high resolution imaging.

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