Abstract. We use Transaction Level Modeling techniques to specify and validate best-effort channels for networked embedded devices, to integrate the generated specification model in system-level design flow, for prototyping, exploration and validation of design alternatives. A best-effort channel does not provide any guarantees on final data delivery or delivery rate. With more embedded devices existing in networked environments, often sharing a common communication channel, devices compete with each other for all common network resources, e.g., in a wireless sensor network where low power devices share a low bandwidth best-effort channel. To examine such systems, we specify Half-Duplex Ethernet using the SpecC language and Transaction Level Modeling techniques. All models are validated in a multi-station test setup using Ethernet-based network algorithms.

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Computer techniques are discussed for the characterization of typical Schottky barrier diodes in a convenient manner for the rapid evaluation of out-or-balance effects such as carrier or. local oscillator leak in conventional two-diode mixer and modulator circuits. The usefulness of the technique in assessing temperature effects on the circuit performance and the influences of individual diode parameters are demonstrated and good agreement achieved between measured and predicted performance for 0. typical circuit,

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