No abstract

Lithium indium diselenide (LISe) is a semiconductor that holds promise for neutron imaging sensor technologies because of its high neutron absorption efficiency and its corresponding ability to discriminate between gamma rays and neutrons. However, being a semiconductor, LISe may not be sufficiently radiation hard for practical application in radiation hard environments. Therefore, a systematic evaluation of the changes in material and electronic properties of LISe after high neutron fluence exposures is investigated. Herein, the characterization methods are utilized which included UV–vis, X‐ray diffraction, radioluminescence, Raman, fourier transform infrared spectroscopy (FTIR), current–voltage, and neutron sensing. Characteristics of LISe material that appeared in the literature are identified herein along with several that are expected to appear based on theoretical analyses. The results obtained show clear changes in the material properties of LISe after neutron exposure up to a fluence of 1016 n cm−2. However, LISe is still able to sense neutrons above the background at 1016 n cm−2, suggesting that LISe may be suitable for use in neutron imaging sensors at neutron imaging facilities.

Li-based semiconductor materials represent a promising alternative to 3-He and scintillation materials for thermal neutron detection and imaging instruments. Semiconductor crystals of LiInSe2, LiInP2Se6, and LiGaInSe2 (LiGa0.5In0.5Se2) were grown using natural and enriched lithium ( 6 Li). The materials were characterized for electronic and optical properties including optical transmission, current-voltage (I-V) characteristic for resistivity, and bandgap. Thermal neutron detectors were fabricated and characterized for neutron and gamma-ray response. Pulse height spectra were collected from a moderated custom-designed 241 AmBe neutron source and a 60 Co gamma-ray source. The LiInSe2 samples exhibited a 2.8 eV cutoff in the optical spectrum and a resistivity of ~8×10 11 Ω•cm. LiInSe2 devices exhibit a noise floor of <30 keV which operated at a field of 630 V/mm, for the 0.8-mm thick device. The Vertical Gradient Freeze (VGF) grown LiInP2Se6 samples exhibited a 2.2 eV cutoff in the optical spectrum and resistivity of ~4×10 12 Ω•cm. The Chemical Vapor Transport (CVT) grown LiInP2Se6 devices exhibit a noise floor of <60 keV which operated at a field of 8,000 V/mm, for the 0.05mm thick device. Furthermore, the long-term stability of LiInSe2 devices during multiple weeks under continuous bias was investigated.