The technical challenges and motivations for high-energy, short-pulse generation with NIF-class, Nd:glass laser systems are reviewed. High energy short pulse generation (multi-kilojoule, picosecond pulses) will be possible via the adaptation of chirped pulse amplification laser techniques on the NIF. Development of meter-scale, high efficiency, high-damagethreshold final optics is a key technical challenge. In addition, deployment of HEPW pulses on NIF is constrained by existing laser infrastructure and requires new, compact compressor designs and short-pulse, fiber-based, seed-laser systems. The key motivations for high energy petawatt pulses on NIF is briefly outlined and includes high-energy, x-ray radiography, proton beam radiography, proton isochoric heating and tests of the fast ignitor concept for inertial confinement fusion
Dynamical diffraction effects in thin single crystals produce highly monochromatic parallel x-ray beams with a mutual separation of a few microns and a time delay of a few femtoseconds-the so-called echoes. This ultrafast diffraction effect is used at X-Ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent x-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step toward the ambitious goal of strain tailoring new x-ray optics and, conversely, open up the possibility of using ultrafast dynamical diffraction effects to study strain in materials.
We propose a new geometry for focused ion beam milled micro-cantilevers, which allows production of residual stress-free, isolated thin film specimens from film-substrate systems. This geometry was used to demonstrate the presence of permanent deformation in about 200 nm thick thermally grown oxide scales on a Ni-base superalloy, after applying large bending displacements insitu in a scanning electron microscope. Stiffness measurements performed before and after the bending tests confirmed the absence of micro-cracks, leading to the conclusion that plastic deformation occurred in the oxide scale. The proposed method is extendable to other film-substrate systems and testing conditions, like non-ambient temperatures.
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