Detecting anomalous regions in images is a frequently encountered problem in industrial monitoring. A relevant example is the analysis of tissues and other products that in normal conditions conform to a specific texture, while defects introduce changes in the normal pattern. We address the anomaly detection problem by training a deep autoencoder, and we show that adopting a loss function based on Complex Wavelet Structural Similarity (CW-SSIM) yields superior detection performance on this type of images compared to traditional autoencoder loss functions. Our experiments on well-known anomaly detection benchmarks show that a simple model trained with this loss function can achieve comparable or superior performance to state-of-the-art methods leveraging deeper, larger and more computationally demanding neural networks. 1