A McPherson ESCA-36 instrument has been upgraded extensively to achieve greatly enhanced x-ray photoelectron spectroscopy (XPS) performance. An SSL position-sensitive detector (PSD) has been retrofitted to the spectrometer in place of the standard exit slit and channel electron multiplier. A DEC LSI-11/73 computer and a Tektronix colour-graphics terminal with ink-jet plotter have been substituted for the o r i g i~l PDP 8/e computer and peripherals. The system vacuum quality also has been significantly improved by installation of modern cryosorption and turbomolecular pumps. A self-contained software package, based on interactive program modules, has been developed for XPS surface analysis, comprising instrument control, data acquisition and data processing. Photoelectron spectra are recorded in the non-retardation scanning mode, utilizing the output from the central 200 channels of the 256-channel PSD. High spectrometer resolution has been maintained by accounting for energy dispersion to second order. Calibration of the spectrometer energy scale and intensity-energy response function is discussed. The suitability of the upgraded ESCA-36 for XPS studies of highly radioactive materials, such as used CANDU fuel, is illustrated.
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