We describe a generalized formalism, addressing the fundamental problem of reflection and transmission of complex optical waves at a plane dielectric interface. Our formalism involves the application of generalized operator matrices to the incident constituent plane wave fields to obtain the reflected and transmitted constituent plane wave fields. We derive these matrices and describe the complete formalism by implementing these matrices. This formalism, though physically equivalent to Fresnel formalism, has greater mathematical elegance and computational efficiency as compared to the latter. We utilize exact 3D expressions of the constituent plane wavevectors and electric fields of the incident, reflected and transmitted waves, which enable us to seamlessly analyse plane waves, paraxial and non-paraxial beams, highly diverging and tightly focused beam-fields as well as waves of miscellaneous wavefront-shapes and properties using the single formalism. The exact electric field expressions automatically include the geometric phase information; while we retain the wavefront curvature information by using appropriate multiplicative factors. We demonstrate our formalism by obtaining the reflected and transmitted fields in a simulated Gaussian beam model; in particular, by exploring the existence and nature of phase vortex in the longitudinal electric field component of the reflected beam -thus showing spin-to-orbital angular momentum conversion. Finally, we briefly discuss how our generalized formalism is capable of analysing the reflection-transmission problem of a very large class of complex optical waves -by referring to some novel works from the current literature as exemplary cases.

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We present a formalism for experimental determination of the orbital angular momentum (OAM) of a paraxial optical beam-field by intertwining Barnett's formalism and Stokes parameter measurements. Using Barnett's formalism we calculate the OAM flux density of a suitably general 2-dimensional beam-field; and re-express it in terms of experimentally measurable quantities. Considering a demonstrative optical system, we obtain the OAM flux density profiles, total OAM flux and OAM per photon -leading towards the experimental characterization of OAM using Barnett's formalism. Our method will find potential applications in nanooptical processes involving the transfer of electromagnetic OAM to particles and across interfaces.