Multifrequency atomic force microscopy (AFM) is shown to be an excellent tool for imaging crystal structures at atomic resolution in different spatial directions. However, determining the forces between single atoms remains challenging, particularly in air under ambient conditions. Developed here is a trimodal AFM approach that simultaneously acquires torsional and flexural frequency‐shift images and spectroscopic data to transfer these observables into in‐plane and out‐of‐plane forces between single bonds of highly oriented pyrolytic graphite (HOPG) at atomic resolution in air under ambient conditions based on the Fourier method. It is found that the cantilever mean deflection is an excellent indicator to understand that strong attractive interactions between the tip and the surface of HOPG in dynamic AFM imply a local lift of the topmost carbon layer when using higher eigenmodes for the topographical feedback. Cross‐talk between torsional and flexural‐oscillation modes is shown to be negligible. Interestingly, significant differences are observed in the in‐plane forces depending on the orientation of the carbon bonds relative to the direction of torsional oscillation.

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Combined in-plane and out-of-plane multifrequency atomic force microscopy techniques have been demonstrated to be important tools to decipher spatial differences of sample surfaces at the atomic scale. The analysis of physical properties perpendicular to the sample surface is routinely achieved from flexural cantilever oscillations, whereas the interpretation of in-plane sample properties via force microscopy is still challenging. Besides the torsional oscillation, there is the additional option to exploit the lateral oscillation of the cantilever for in-plane surface analysis. In this study, we used different multifrequency force microscopy approaches to attain better understanding of the interactions between a super-sharp tip and an HOPG surface focusing on the discrimination between friction and shear forces. We found that the lateral eigenmode is suitable for the determination of the shear modulus whereas the torsional eigenmode provides information on local friction forces between tip and sample. Based on the results, we propose that the full set of elastic constants of graphite can be determined from combined in-plane and out-of-plane multifrequency atomic force microscopy if ultrasmall amplitudes and high force constants are used.

Combined in-plane and out-of-plane multifrequency atomic force microscopy techniques have been demonstrated to be important tools to decipher spatial differences of sample surfaces at the atomic scale. The analysis of physical properties perpendicular to the sample surface is routinely achieved from flexural cantilever oscillations, whereas the interpretation of in-plane sample properties via force microscopy is still challenging. Besides the torsional oscillation, there is the additional option to exploit the lateral oscillation of the cantilever for in-plane surface analysis. In this study, we used different multifrequency force microscopy approaches to attain better understanding of the interactions between a super-sharp tip and an HOPG surface focusing on the discrimination between friction and shear forces. We found that the lateral eigenmode is suitable for the determination of the shear modulus whereas the torsional eigenmode provides information on local friction forces between tip and sample. Based on the results, we propose that the full set of elastic constants of graphite can be determined from combined in-plane and out-of-plane multifrequency atomic force microscopy if ultrasmall amplitudes and high force constants are used.