A soft x-ray spectrometer based on the use of an elliptical focusing mirror and a plane varied line spacing grating is described. It achieves both high resolution and high overall efficiency while remaining relatively compact. The instrument is dedicated to resonant inelastic x-ray scattering studies. We set out how this optical arrangement was judged best able to guarantee performance for the 50 - 1000 eV range within achievable fabrication targets. The AERHA (adjustable energy resolution high acceptance) spectrometer operates with an effective angular acceptance between 100 and 250 μsr (energy dependent) and a resolving power well in excess of 5000 according to the Rayleigh criterion. The high angular acceptance is obtained by means of a collecting pre-mirror. Three scattering geometries are available to enable momentum dependent measurements with 135°, 90°, and 50° scattering angles. The instrument operates on the Synchrotron SOLEIL SEXTANTS beamline which serves as a high photon flux 2 × 200 μm(2) focal spot source with full polarization control.
We have designed, built, and tested a new instrument for soft x-ray scattering experiments. The reflectometer works under ultrahigh vacuum and permits in situ preparation and characterization of the samples. In particular, deposition and sputtering operations can be performed while measuring x-ray scattering. We report the results of test measurements performed using synchrotron radiation. The precision of the combined positioning of sample and detector angles is better than 0.01°. Separately, sample and detector rotations have a repeatability that is better than 0.005°. Applications will be in the field of surface physics, with emphasis on magnetic properties of surfaces, thin films, and multilayered structures.
We describe a soft x-ray spectrometer covering the 120–800 eV range. It is intended for resonant inelastic x-ray scattering experiments performed at third generation synchrotron radiation (SR) facilities and has been developed with SOLEIL, the future French national SR source in mind. The Hettrick–Underwood principle is at the heart of the design using a combination of varied line-spacing plane grating and spherical-mirror to provide a flat-field image. It is slitless for optimum acceptance. This means the source size determines the resolving power. A spot size of ⩽5μm is planned at SOLEIL which, according to simulations, should ensure a resolving power ⩾1000 over the whole energy range. A 1024×1024 pixel charge-coupled device (CCD) with a 13μm×13μm pixel size is used. This is an improvement on the use of microchannel-plate detectors, both as concerns efficiency and spatial resolution. Additionally spectral line curvature is avoided by the use of a horizontal focusing mirror concentrating the beam in the nondispersing direction. It allows for readout using a binning mode to reduce the intrinsically large CCD readout noise. Preliminary results taken at beamlines at Elettra (Trieste) and at BESSY (Berlin) are presented.
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