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Pulse initiated systems are designed to reliably and consistently operate when energized above a threshold value. The situation exists where these systems can be exposed to pulsed and transient signals that are directly injected due to external coupling factors that do not initiate the system. This paper will examine the potential for transient currents to cause unforeseen stress to theses electrical devices and systems, which can lead to aging, malfunction and possibly failure. This work will address the process of quantifying the detrimental effects, in order to understand non-ideal performance or the mechanics of failure due to pulsed and other transient currents that are less than what is required to initiate. A test and data acquisition circuit is designed and built that enables a constant current source to pulse the device under test. The data collected will be compared to the theoretical results of a finite element multi-physics simulation. Upon completion, any changes in resistive properties will be evaluated to determine if there were quantifiable effects that have contributed to the aging process.

Pulse initiated systems are designed to reliably and consistently operate when energized above a threshold value. The situation exists where these systems can be exposed to pulsed and transient signals that are directly injected due to external coupling factors that to not initiate the system. This paper will examine the potential for transient currents to cause unforeseen stress to these electrical devises, which can lead to aging, malfunction and possibly failure. This work will address the process of quantifying the detrimental effects, in order to understand non-ideal performance or the mechanics of failure due to pulsed and other transient currents that are less than what is required to initiate. A test and data acquisition circuit is designed and built that enables a constant current source to pulse a device under test. The data collected will be compared to the theoretical results of a finite element multi-physics simulation. Upon completion, any changes in resistive properties will be evaluated to determine if there were quantifiable effects that have contributed to the aging process.

I. ABSTRACTElectromagnetic pulses (EMP) can be very destructive and protecting against them is crucial. This paper discusses a method to determine the effects an intentional EMP would have on a system with multiple layers of different materials by simulating the exposure to electromagnetic waves in ANSYS HFSS. Worst case scenarios are tested by applying wavelengths that result in a resonant frequency through the object. The results show the magnitude of the current densities at the surface of the object induced by the EMP waves. The impact of the waves can be determined by reviewing the current density through the object with respect to the physical properties of the materials. Report Documentation PageForm Approved OMB No. 0704-0188Public reporting burden for the collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Send comments regarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing this burden, to Washington Headquarters Services, Directorate for Information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington VA 22202-4302. Respondents should be aware that notwithstanding any other provision of law, no person shall be subject to a penalty for failing to comply with a collection of information if it does not display a currently valid OMB control number.