Articles you may be interested in Xray photoelectron spectroscopy study on composition and structure of solgel derived PbTiO3 thin films Difference Raman spectra of PbTiO3 thin films grown by metalorganic chemical vapor deposition A novel in situ stress measurement technique to study the formation kinetics of multicomponent oxide thin films was developed and was applied to PbTiO 3. Single phase PbTiO 3 thin films were formed from the reaction between films in the deposited PbO/TiO 2 multilayer. The film stoichiometry was accurately controlled by depositing individual layers with the required thickness. The development of film stresses associated with the formation of the product layer at the PbO/TiO 2 interface of the multilayers was used to monitor the growth rate of the PbTiO 3 layer. It was found that growth of the PbTiO 3 phase obeyed the parabolic law, and the effective activation energy was estimated to be 108 kJ/mole. It is believed that the mechanism of this reaction was dominated by grain boundary diffusion of the participating cations.
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