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Multilayer thin films of metallic nanoclusters, polymers and other molecules have been formed using a novel electrostatic self-assembly method and analysed by multiple characterization techniques. Nanocluster size measurements, ellipsometry and UV-visible absorption spectroscopy have been used to confirm the linear build-up of the thin film thickness with the number of deposited nanocluster, polymer and other molecular layers. Auger electron spectroscopy allowed verification of the distribution of molecular species through thick films with multilayer segments containing different elements. Field emission scanning electron microscopy and atomic force microscopy permitted visualization of the morphologies of the outermost layers of the deposited films. Together, such characterization allows improved understanding and the basis for the design of multilayer thin film materials engineered to have specific molecular level structures and macroscopic functionalities.

electronic properties of the CdS clusters are sensitive to synthesis conditions, including dendrimer type, solvent type, and the concentration of dendrimer and other solutes. The dendrimers stabilize the CdS clusters, forming CdS/ dendrimer nanocomposites. These nanocomposite particles subsequently undergo slow aggregation in solution. Despite this aggregation, the optoelectronic properties of the nanocomposites in solution remain stable for months, presumably due to the continued stabilization of the CdS clusters by the dendrimer matrix. Thin films of these materials prepared by solution casting retain the optoelectronic properties of the parent solutions. These features suggest that CdS/dendrimer nanocomposites may be useful for fabricating novel optical sensors and microelectronic devices using simple synthesis and processing procedures.

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