Beryllium nitride thin films were grown on silicon substrates by laser ablating a beryllium foil in molecular nitrogen ambient. The composition and chemical state were determined with Auger (AES), X-Ray photoelectron (XPS) and energy loss (EELS) spectroscopies. A low absorption coefficient in the visible region, and an optical bandgap of 3.8 eV, determined by reflectance ellipsometry, were obtained for films grown at nitrogen pressures higher than 25 mTorr. The results show that the reaction of beryllium with nitrogen is very effective using this preparation method, producing high quality films.keywords: Beryllium nitride, laser ablation, thin films, wide bandgap, optical properties.
We have studied the formation of yttrium nitride in which the Y-atoms were arranged in two common close-packed stacking: The AB-stacking (hcp-symmetry) is the ground state of metallic yttrium; while the ABC-stacking (fcc-symmetry) is the ground state of yttrium nitride. Given the different symmetries between YN and Y, there must be a phase transition (hcp → fcc) as N is incorporated in the Y-lattice. By means of first principles calculations we have made a systematical investigation where N was gradually incorporated in octahedral interstices in AB and ABC stacking of Y. We report the heat of formation, bulk modulus, lattice parameter and electronic structure of the resultant nitrides. We found that both metal arrangements are physically achievable. Furthermore, for low nitrogen incorporation the two phases may coexist. However for high nitrogen concentration the cubic phases are favored by a 30 kJ mol -1 margin.These results are important since fcc-YN is semiconducting and could be utilized as active layer in electronic devices.
First principles total energy calculations have been applied to describe the ReCN bulk structure and the formation of ReCN monolayers and bilayers. Results demonstrate a strong structural rearrangement in the monolayer due to a reduced dimension effect: an increase in the lattice parameter, accompanied with the contraction of the distance between the C and N planes. On the other hand, a ReCN bilayer has structural parameters similar to those of the bulk. Surface formation energies show that the monolayer is more stable than bilayer geometries. Although bulk ReCN shows a semiconductor behavior, the monolayer ReCN presents a metallic behavior. This metallic character of the ReCN monolayer is mainly due to the d-orbitals of Re atoms.
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