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An in-lab x-ray spectrometer is described which is capable of rapid acquisition of x-ray absorption fine structure data for either extended x-ray absorption fine structure measurements (EXAFS), or x-ray absorption near edge structure studies (XANES). Intensities in excess of 107 photons/s in an ∼10 eV bandpass near 9 keV have been obtained using only a conventional sealed, fixed anode x-ray tube operating at 1.5 kW. The spectrometer utilizes a focusing Johansson cut and bent single crystal as the monochromator and scans continuously from 8≲2θ≲160 degrees with only a single stepping motor driven movement. For 3d metal absorption edges, resolutions of ∼10eV are obtained in first order with a Ge(111) crystal and ∼1 eV in third order allowing in-lab acquisition of both EXAFS and XANES data of synchrotron-like quality.

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