Zinc sulfide (ZnS) thin films were deposited on glass substrate with different thickness by radiofrequency (RF) magnetron sputtering technique, and deals with effect of thickness on the optical and structural properties. The structure, surface morphology and optical properties are investigated by x-ray diffraction (XRD), atomic forces microscopy (AFM), scanning electron microscopy, and UV-visible spectrophotometer.  The result of XRD show that ZnS thin film exhibited cubic structure with strong peaks at (111) as highly preferential orientation. The maximum particle size of films was found to be 14.4 at thickness 868nm. SEM image show that the shape of grain is like spherical. The result of AFM shows that the surface roughness decrease with increasing in film thickness from (6.19 to 1.45)nm. The result of UV-visible suggests that transmittance increasing with increases in film thickness, the value maximum of ZnS transmission was 87.82%  at thickness 868nm, can be very much useful in the field of solar cell and optical sensor .   http://dx.doi.org/10.25130/tjps.24.2019.113

In this study, ZnS: Mn thin films prepared by RF magnetron sputtering technique, were mixed 20 g of ZnS with Mn (2%), and deposited on glass substrate at temperature of 100oC with different thickness (404, 775, and 900) nm. The prepared films were investigated by X-ray diffraction (XRD), atomic force microscopic(AFM), scanning electronic microscopic (SEM), and UV-VIS spectrophotometer. XRD results shows that the films have single crystallization nature with cubic crystal structure (Zinc blende) and strong peaks at (111) as highly preferential orientation. SEM and  AFM analysis indicates that the diameter of particles were found to be nanometer, it ranged up to 29.55nm, 89.42nm at thickness (900nm) respectively. The results of UV-Vis spectrophotometry show that the transparency of films with different thickness was found to be around 53.43-86.63% in visible range. The band gap energies are calculated to be between 3.20-3.70 eV.

Zinc sulfide (ZnS) thin films were deposited on glass substrate with different thickness by radiofrequency (RF) magnetron sputtering technique, and deals with effect of thickness on the optical and structural properties. The structure, surface morphology and optical properties are investigated by x-ray diffraction (XRD), atomic forces microscopy (AFM), scanning electron microscopy, and UV-visible spectrophotometer.  The result of XRD show that ZnS thin film exhibited cubic structure with strong peaks at (111) as highly preferential orientation. The maximum particle size of films was found to be 14.4 at thickness 868nm. SEM image show that the shape of grain is like spherical. The result of AFM shows that the surface roughness decrease with increasing in film thickness from (6.19 to 1.45)nm. The result of UV-visible suggests that transmittance increasing with increases in film thickness, the value maximum of ZnS transmission was 87.82%  at thickness 868nm, can be very much useful in the field of solar cell and optical sensor .

In this study, ZnS: Mn thin films prepared by RF magnetron sputtering technique, were mixed 20 g of ZnS with Mn (2%), and deposited on glass substrate at temperature of 100oC with different thickness (404, 775, and 900) nm. The prepared films were investigated by X-ray diffraction (XRD), atomic force microscopic(AFM), scanning electronic microscopic (SEM), and UV-VIS spectrophotometer. XRD results shows that the films have single crystallization nature with cubic crystal structure (Zinc blende) and strong peaks at (111) as highly preferential orientation. SEM and  AFM analysis indicates that the diameter of particles were found to be nanometer, it ranged up to 29.55nm, 89.42nm at thickness (900nm) respectively. The results of UV-Vis spectrophotometry show that the transparency of films with different thickness was found to be around 53.43-86.63% in visible range. The band gap energies are calculated to be between 3.20-3.70 eV.    http://dx.doi.org/10.25130/tjps.24.2019.091