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A generalized cavity method relaxing the major assumptions of conventional cavity perturbation technique is presented for characterization of the powdered sample in the microwave frequency range. The unified method, which is based on the inverse optimization technique, eliminates the complexity of measurement caused due to the existence of sample holder and produces an accurate result. In this paper, an attractive numerical calibration approach is proposed in lieu of the practical calibration technique which usually requires either a set of standards or a number of reference samples. The sample holder especially made of borosilicate glass is designed to contain the powdered samples, and the X-band rectangular cavity is fabricated. For verification of the proposed technique, the pulverized alumina and polyethylene oxide with various packing fractions are measured using the fabricated cavity and the vector network analyzer. The dielectric constant of these samples is extracted using the proposed unified approach which is found to be in good agreement with the theoretical data obtained by Landau-Lifshitz and Looyenga model. The accuracy of the proposed generalized cavity method for powdered samples is found to be better than the conventional resonator methods available in the literature.