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Transverse electromagnetic (TEM) cells are usually used to perform electromagnetic interference (EMI) measurements of equipment inside the cell in a plane wave-field environment. This paper describes a new technique of generating predominantly highimpedance electric or low-impedance magnetic fields inside a TEM cell for EM1 measurements of relatively small size printed circuit boards (PCBs), electronic devices, etc. The technique simulates environments similar to the near-field EM1 environment for intrasystem EMI/EMC studies. Variations of electric and magnetic fields, and impedances along the length of the cell, are given. The results indicate that a reasonable size test region exists in the cell over which the field amplitudes are uniform within 2 1 dB.

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