No abstract

No abstract

Abstract-This paper presents a novel test point insertion method for pseudorandom built-in self-test (BIST) to reduce the area overhead. The proposed method replaces dedicated flip-flops for driving control points by existing functional flip-flops. For each control point, candidate functional flip-flops are identified by using logic cone analysis that investigates the path inversion parity, logical distance, and reconvergence from each control point. Four types of new control point structures are introduced based on the logic cone analysis results to avoid degrading the testability. Experimental results indicate that the proposed method significantly reduces test point area overhead by replacing the dedicated flip-flops and achieves essentially the same fault coverage as conventional test point implementations using dedicated flip-flops driving the control points.

No abstract

This paper presents a novel method for reducing the area overhead introduced by test point insertion. Test point locations are calculated as usual using a commercial tool. However, the proposed method uses functional flip-flops to drive control test points instead of test-dedicated flip-flops. Logic cone analysis that considers the distance and path inversion parity from candidate functional flip-flops to each control point is used to select an appropriate functional flip-flop to drive the control point which avoids adding additional timing constraints. Reconvergence is also checked to avoid degrading the testability. Experimental results indicate that the proposed method significantly reduces test point area overhead and achieves essentially the same fault coverage as the implementations using dedicated flipflops driving the control points.