The conjugated polymer, poly(2,5‐bis(3‐hexadecylthiophen‐2‐yl)thieno[3,2‐b]thiophene) (pBTTT‐C16), allows a systematic tuning of the blend morphology by varying the acceptor type and fraction, making it a well‐suited structural model for studying the fundamental processes in organic bulk heterojunction solar cells. To analyze the role of intercalated and pure fullerene domains on charge carrier photogeneration, time delayed collection field (TDCF) measurements and Fourier‐transform photocurrent spectroscopy (FTPS) are performed on pBTTT‐C16:[6,6]‐phenyl‐C61‐butyric acid methyl ester (PC61BM) solar cells with various stoichiometries. A weak influence of excess photon energy on photogeneration along with a photogeneration having a weaker field dependence at increasing fullerene loading is found. The findings are assigned to a dissociation via thermalized charge transfer (CT) states supported by an enhanced electron delocalization along spatially extended PC61BM nanophases that form in addition to a bimolecular crystal (BMC) for PC61BM rich blends. The highly efficient transfer of charge carriers from the BMC into the pure domains are studied further by TDCF measurements performed on non‐intercalated pBTTT‐C16:bisPC61BM blends. They reveal a field dependent charge generation similar to the 1:4 PC61BM blend, demonstrating that the presence of pure acceptor phases is the major driving force for an efficient, field independent CT dissociation.

Interference signals in coherence scanning interferometry at high numerical apertures and narrow bandwidth illumination are spectrally broadened. This enables phase analysis within a spectral range much wider than the spectral distribution of the light emitted by the light source. Consequently, different surface features can be resolved depending on the wavelength used for phase analysis of the interference signals. In addition, the surface topography itself affects the spectral composition of interference signals in different ways. Signals related to tilted surfaces or step height structures show special spectral characteristics. Thus, spectral amplitude and phase analysis enables a better understanding of the underlying physical mechanisms and gives hints how to improve the measurement accuracy.

To get physical insight into the 3D transfer characteristics of interference microscopy at high numerical apertures we study reflecting rectangular grating structures. In general, the height obtained from phase information seems to be reduced, whereas height values resulting from coherence scanning sometimes seem to be systematically overestimated. Increasing the numerical aperture of an interference microscope broadens the spectra of the resulting interference signals, thus offering a broad variety of wavelength contributions to be analyzed. If phase analysis of a measured far-field interference wavefront is performed at very short wavelengths the periodical profiles obtained from coherence scanning and phase shifting analysis differ only by the measured amplitude. However, at longer wavelength there is a 180° phase shift of the measured profiles obtained from phase analysis compared to coherence peak analysis. Increasing the evaluation wavelength improves the lateral resolution since the long wavelength contributions are related to electromagnetic waves of high angles of incidence. This behavior is to the best of our knowledge not documented in literature so far. It was first observed experimentally and could be confirmed by simulation results obtained from either Kirchhoff diffraction theory or an extended Richards-Wolf model developed in our group. Compared to original input profiles used for the simulation the profiles obtained from phase evaluation correspond quite well at longer wavelength, whereas the results obtained from coherence peak analysis are typically inverted with respect to height.

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