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Numerical analysis followed by experimental investigations are done with heterostructure GaN/AlGaN single drift MIxed Tunnelling and Avalanche Transit Time (MITATT) devices grown on Si〈111〉 substrate, at around 1 THz. A generalised self-consistent, nonlinear Mixed Quantum Drift-Diffusion (MQDD) simulator is developed and used for designing p ++-n −-n-n ++ type room temperature solid-state source within 0.75-1.1 THz regime. The epitaxial heterojunction layers are grown by III-V nitride molecular beam epitaxy which has enabled the realisation of GaN/AlGaN periodic structure on Si〈111〉 substrate with AlN buffer layer. For the first time, the realisation of heterostructure III-V Nitride MITATT oscillator at sub-mm wave/terahertz (THz) frequencies is done. The device is observed to oscillate at 1 THz with ∼4%. A comparison of MQDD model with experimental (On wafer DC testing) results for heterojunction GaN/AlGaN MITATT diodes shows generalised agreement in terms of breakdown voltage (∼27 V) and efficiency (∼4%). First experimental results of GaN/AlGaN heterostructure MITATT diode are reported and compared with the theoretical predictions obtained through MQDD model.

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