Self-amplified spontaneous emission in a free-electron laser has been proposed for the generation of very high brightness coherent x-rays. This process involves passing a high-energy, high-charge, short-pulse, low-energy-spread, and low-emittance electron beam through the periodic magnetic field of a long series of high-quality undulator magnets. The radiation produced grows exponentially in intensity until it reaches a saturation point. We report on the demonstration of self-amplified spontaneous emission gain, exponential growth, and saturation at visible (530 nanometers) and ultraviolet (385 nanometers) wavelengths. Good agreement between theory and simulation indicates that scaling to much shorter wavelengths may be possible. These results confirm the physics behind the self-amplified spontaneous emission process and forward the development of an operational x-ray free-electron laser.

Control and acquisition systems for new scanning transmission x-ray microscopes at Advanced Light Source (abstract) Rev. Sci. Instrum. 73, 1591 (2002; 10.1063/1.1448125Simple method for estimating linear attenuation coefficients from x-ray diffraction tomography data Rev. Sci. Instrum. 72, 1918 (2001; 10.1063/1.1344171 2D imaging by X-ray fluorescence microtomography AIP Conf.A third-generation synchrotron radiation source provides enough brilliance to acquire complete tomographic data sets at 100 nm or better resolution in a few minutes. To take advantage of such high-brilliance sources at the Advanced Photon Source, we have constructed a pipelined data acquisition and reconstruction system that combines a fast detector system, high-speed data networks, and massively parallel computers to rapidly acquire the projection data and perform the reconstruction and rendering calculations. With the current setup, a data set can be obtained and reconstructed in tens of minutes. A specialized visualization computer makes rendered three-dimensional ͑3D͒ images available to the beamline users minutes after the data acquisition is completed. This system is capable of examining a large number of samples at sub-m 3D resolution or studying the full 3D structure of a dynamically evolving sample on a 10 min temporal scale. In the near future, we expect to increase the spatial resolution to below 100 nm by using zone-plate x-ray focusing optics and to improve the time resolution by the use of a broadband x-ray monochromator and a faster detector system.

Modern scientific experiments can generate hundreds of gigabytes to terabytes or even petabytes of data that may furthermore be maintained in large numbers of relatively small files. Frequently, this data must be disseminated to remote collaborators or computational centers for data analysis. Moving this data with high performance and strong robustness and providing a simple interface for users are challenging tasks. We present a data transfer framework comprising a high-performance data transfer library based on GridFTP, a data scheduler, and a graphical user interface that allows users to transfer their data easily, reliably, and securely. This system incorporates automatic tuning mechanisms to select at runtime the number of concurrent threads to be used for transfers. Also included are restart mechanisms capable of dealing with client, network, and server failures. Experimental results indicate that our data transfer system can significantly improve data transfer performance and can recover well from failures.

We describe our recent work on developing X-ray diffraction microscopy as a tool for studying three dimensional microstructure dynamics. This is a measurement technique that is demanding of experimental hardware and presents a challenging computational problem to reconstruct the sample microstructure. A dedicated apparatus exists at beamline 1-ID of the Advanced Photon Source for performing these measurements. Submicron mechanical precision is combined with focusing optics that yield ≈2μmhigh×1.3mm wide line focused beam at 50keV. Our forward modeling analysis approach generates diffraction from a simulated two dimensional triangular mesh. Each mesh element is assigned an independent orientation by optimizing the fit to experimental data. The method is computationally demanding but is adaptable to parallel computation. We illustrate the state of development by measuring and reconstructing a planar section of an aluminum polycrystal microstructure. An orientation map of ∼90 grains is obtained along with a map showing the spatial variation in the quality of the fit to the data. Sensitivity to orientation variations within grains is on the order of 0.1deg. Volumetric studies of the response of microstructures to thermal or mechanical treatment will soon become practical. It should be possible to incorporate explicit treatment of defect distributions and to observe their evolution.

No abstract