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This paper describes application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry. The utility of this approach for preliminary latchup screening of both COTS and spacequalified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune is presented in detail. The design modifications are described.

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