Terahertz time-domain spectroscopy (THz-TDS) was employed for estimation of intrinsic dielectric loss of Zr0.8Sn0.2TiO4 (ZST) ceramics. Single-phase ZST dielectric resonators (DRs) with various synthesis parameters and, consequently, different extrinsic losses, were prepared by conventional ceramic technology. Even though the DRs exhibit a similar microstructure, their quality factor (Q is the inverse of dielectric loss tangent) measured in microwave (MW) domain at 6 GHz varies between 2500 and 8400. On the other hand, it was found that the THz dielectric loss is less sensitive to the sample preparation. The intrinsic losses (Q × f ~60 THz) of the ZST ceramics have been derived from THz data.

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Zr0.8Sn0.2TiO3 (ZST) powders synthesized by solid-state reaction were subject to processing by spark plasma sintering (SPS). A single-phase ceramic with a high relative density of 95.7% and 99.6% was obtained for sintering temperatures of 1150 °C and 1200 °C, respectively, and for a dwell time of 3 min. In order to reduce the oxygen vacancies, as-sintered discs were annealed in air at 1000 °C. The dielectric loss of the annealed samples, expressed by the Q × f product, measured in the microwave (MW) domain, varied between 35 THz and 50 THz. The intrinsic losses (Q × f ~ 60 THz) were derived by using terahertz time-domain spectroscopy (THz-TDS).

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Zinc silicate ceramics have been prepared by using conventional ceramic technology. Morphological, structural, and dielectric characterizations of the samples were performed using scanning electron microscopy, X-ray diffraction, and terahertz time-domain spectroscopy. The achieved absorption properties of zinc silicates make them very attractive solutions for submillimeter-wave applications.