Polycrystalline CdSxTe1-x thin films deposited using a novel procedure based
on the close spaced sublimation (CSS) method were characterized through
thermoelectric power (α) measurements. The results revealed that these types of
compounds present mixed conductivity and that their net conductivity becomes
n-type for S concentrations greater than 50% (x>0.5) and p-type when the
S content is less than 50%.
The results were interpreted with the help of theoretical calculations of
α versus T, carried out using a model which includes scattering processes inside
the grain and in the grain boundaries as well as dimensional effects.
Comparing experimental values of α versus T with the theoretical calculation, it was
found that the electrical transport in the CdSxTe1-x thin films is mainly
affected by the interaction of electrons and holes with acoustic phonons and
by scattering processes in the intergrain regions. The surface and bulk
thermal conductivity also influence the electrical transport of the CdSxTe1-x
films.
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