Amostras de silício poroso (PS) foram obtidas pelo processo de anodização em lâminas de Si tipo n, dopadas com fósforo. A oxidação eletroquímica do PS foi obtida utilizando-se solução de ácido fluorídrico (HF) contendo aditivos como etanol e acetonitrila (MeCN). A formação dos poros foi estudada com a variação da resistividade das laminas de Si e parâmetros de processo como: concentração do ácido, densidade de corrente e tempo de anodização. As técnicas de Microscopia Eletrônica de Varredura (MEV) e Espectroscopia de Espalhamento Raman foram utilizadas para a investigação da morfologia e fotoluminescência, respectivamente. A camada de PS formada com o uso da solução de HF-MeCN mostrou maior uniformidade e homogeneidade na distribuição dos macroporos com diferentes tipos e tamanhos. Esse comportamento pode ser explicado devido a tensão superficial da MeCN ser maior que a do etanol. Consequentemente, as moléculas de MeCN podem passivar a superfície do silício durante o processo de anodização.Porous silicon (PS) samples were obtained by anodization etching process of n-type silicon wafer phosphorus-doped. Electrochemical oxidation of PS was investigated in aqueous hydrofluoric acid (HF) containing additive such as ethanol or acetonitrile. Pore formation was studied with the variation of type and resistivity of the silicon wafer, taking into account the most important anodization process parameters such as: acid concentration, current density and anodization time. Scanning Electron Microscopy (SEM) and Raman Scattering Spectroscopy measurements were used to characterize the macropore morphology changes and sample photoluminescense responses, respectively. PS layer formed in HF-acetonitrile solution showed more uniform and homogeneous macropore distributions with different shapes and sizes. Behavior may be explained because acetonitrile surface tension is greater than that of ethanol. Therefore, acetonitrile molecules might passivate the silicon surface dissolved during the anodization process. Keywords: porous silicon, HF-acetonitrile, HF-ethanol IntroductionSince the discovery of its visible photoluminescence (PL) at room temperature, porous silicon (PS) has been intensively studied. Nowadays, PS is considered a very attractive material for the sensing layer in a chemical sensor, sacrificial layer in micromachining, and light emitting diode (LED) in optoelectronic devices. [1][2][3][4] Porous Si might be formed by electrochemical etching of single monocrystalline Si in HF solutions containing additives as ethanol or acetonitrile (MeCN). However, the anodization process was firstly studied by Bomchil et al., 5 in 1983, using HF and ethanol solution and they reported that ethanol improved the homogeneity of PS layer. Consequently, HF-ethanol has been used by most research groups as the standard electrolyte for PS formation process. After that, Propst et al. 6 have reported the electrochemical oxidation of p-and n-type silicon in nonaqueous electrolyte of HF-MeCN and discussed their singular and large porous structure...

Nanocrystalline diamond (NCD) films were formed on porous silicon (PS) substrate by Chemical Vapor Deposition/Infiltration (CVD/CVI) process using a hot filament reactor. This innovative procedure is determinant to grow a controlled three-dimensional diamond structure with diamond grains formation in the pores, covering uniformly the different growth planes. In this CVI process, a piece of reticulated vitreous carbon (RVC) was used, under de PS substrate, as an additional solid source of hydrocarbon that ensures the production of pertinent carbon growth species directly on PS and into its pores. PS substrates were obtained by anodization etching process of n-type silicon wafer in a hydrofluoric acid (HF) solution containing acetonitrile (CH3CN) which result in an uniform and well controlled porous distribution and size when compared with the usual ethanol solution. Depositions were performed using Ar-H2-CH4 where the methane concentration varied from 0 up to 1.0 vol%, to analyze the influence of RVC use as an additional carbon source on growth mechanism. Scanning Electron Microscopy (SEM) and Field Emission Gun (FEG) were used to investigate PS and NCD film morphology. SEM images of NCD showed faceted nanograins with average size from 5 to 16 nm and uniform surface texture covering all the supports among the pores resulting in an apparent micro honeycomb structure. Raman spectra confirmed the existence of sp2-bonded carbon at the grain boundaries. The spectra showed a peak that may be deconvoluted in two components at 1332 cm(-1) (diamond) and 1345 cm(-1) (D band). Two shoulders at 1150 and 1490 cm(-1) also appear and are assigned to transpolyacetylene (TPA) segments at the grain boundaries of NCD surfaces. In addition, X-ray diffraction analyses of all films presented characteristic diamond diffraction peaks corresponding to (111), (220) and (311).

This paper applies a combined precision stage to fabricate micro-structures by two-photon polymerization (TPP). The combined stage consists of PZT and stepper-motor stages to achieve precision positioning in long displacements. First, we derive the models of the stages by identification experiments. Second, we apply robust loop-shaping techniques to improve the positioning performance of the stages. Third, we integrate the stages and develop a multi-loop control structure to provide long-stroke and high precision. In addition, we propose coordinate transformation and anti-locking functions for further improvement of the system performance. Last, we apply the combined stage to a TPP system for fabricating micro-structures, and define performance indexes based on image processing and optical qualities. The obtained performance criteria can be used to adjust controller design to improve precision manufacturing.

Porous silicon layers (PSL) were produced by stain etching from a HF:HNO3 500:1 mixture with etching time varying in the range of 1 up to 10 min. The samples have presented nanometric porosity as a function of etching time, characteristic of heavily doped p type silicon. The residual stress and the correlation length of the layers were obtained through the analysis of the micro-Raman spectra using a phonon confinement model including a term to account for the amorphous phase. The residual compressive stress tends to increase as expected due to the contribution of smaller crystallites to be more representative as the etching time increases. PbTe thin films were electrodeposited on PSL from aqueous alkaline solutions of Pb(CH3COO)2, disodium salt of ethylendiaminetetraacetic acid (EDTA) and TeO2 by galvanostatic and potentiostatic method. It was also obtained nanostructured PbTe thin films with polycrystalline morphology evidenced by X-ray Diffraction (XRD) spectra. Scanning Electron Microscopy (SEM) analysis has demonstrated good films reproducibility with an average grain size of 100 nm

No abstract