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Silicon fault diagnosis, the process of locating faults in a chip prototype, becomes more challenging and timeconsuming with increasing design complexity. Consistency-based fault diagnosis aims at identifying fault candidates for an erroneous execution trace by symbolically checking the consistency between the golden gate-level model and the faulty behavior of the prototype chip. The scalability of this technique is limited to short executions due to the underlying decision procedure. This problem has previously been addressed by restricting the analysis to a window of fixed size and moving it along the execution trace. In this setting, limited observability results in a loss of precision and potentially missed fault candidates.We present a novel interpolation-based framework which formalizes the propagation of state information across sliding windows as a satisfiability problem. Our approach provides both spatial and temporal localization for general faults and is not restricted to a specific fault model. Further, our approach can be used to provide more accurate localization for a single permanent fault model. We experimentally demonstrate the efficacy and scalability of this approach by applying it to a variety of benchmarks from multiple suites (OpenCores, ITC99 and HWMCC).

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