Electron photoinjectors provide high-brightness electron beams to numerous research applications in physics, chemistry, material, and life sciences. Semiconductor photocathodes are widely used here, as they enable the production of low-emittance beams with variable charge at high repetition rates. One of the key figures of merit of photocathodes is the minimum achievable bunch length. In semiconductor cathodes, this is dominated by scattering effects and varying penetration depths of the extracting photons, which leads to a characteristic electron emission function. We present a method to determine this cathode time response with resolution on the tens of femtoseconds level, breaking the resolution barrier encountered in previous studies. The method is demonstrated with cesium-telluride (Cs2Te) and gold cathodes, revealing response times of (184 ± 41) fs up to (253 ± 58) fs for the semiconductor and an upper limit of (93 ± 17) fs for the metal. Monte Carlo simulations of Cs2Te emission benchmarked to these results give detailed information about the cathode material.

In state of the art photoinjector electron sources, thermal emittance from photoemission dominates the final injector emittance. Therefore, low thermal emittance cathode developments and diagnostics are very important. Conventional thermal emittance measurements for the high gradient gun are time-consuming and thus thermal emittance is not measured as frequently as quantum efficiency during the lifetime of photocathodes, although both are important properties for the photoinjector optimizations. In this paper, a single shot measurement of photoemission transverse momentum, i.e., thermal emittance per rms laser spot size, is proposed for photocathode RF guns. By tuning the gun solenoid focusing, the electrons' transverse momenta at the cathode are imaged to a downstream screen, which enables a single shot measurement of both the rms value and the detailed spectra of the photoelectrons' transverse momenta. Both simulations and proof of principle experiments are reported.

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