To solving the slow and complex scanning of spotscan model in optical coherence tomography (OCT), a fast lateral line-scan model was investigated with doublet-cylinder-lens(DCL). For the DCL, the elimination of spherical aberration was theoretically studied, as well as the beam model and the focus. The parameters and signal characteristics of the confocus microscopy system (CFM S) with DCL were simulated and brought forward. The relation between the transverse resolution and the numerical aperture and the depth of focus (DOF) was discussed in the OCT. Results show that the spherical aberration and the sine aberration of the DCL with K9-ZF2 glass are effectively eliminated. Because the beam is uniformly focused on the arc-sagitta-plane of cylinder lens and produces the parallel interference pattern or fringe with axial symmetry, the transverse resolution interacted by the numerical aperture and the DOF is improved. The scanning velocity of the CFM S with DCL is faster three orders of magnitude than the traditional spot-scan model. The transverse resolution with system aperture 50.8 mm is 15μm. This advanced system will be valuable in real-time vivo imaging.

For the thin-film thickness monitoring(TFTM) system, a new technology based on a double-frequency modulation equipment, a photoelectric four-light path system, a comprehensive digital processing-controlling system and a dual-lock-phase circuit system, has been successfully developed by optimizing the circuitry and data processing to improve the precision of the photoelectricityextremum technology. The novel technique includes analog circuits of multi-stage amplifier, symmetrical dual-lock-phase amplifier, antidisturbance circuit technique, digital division, anti-pulse-disturbance digital filter, linearization of digital display, removal singular data, and extremum judgment with ΔR algorithm. Experiments show that the detection and optimization methods on weak photoelectric signal take advantages of higher stability and better static and dynamic precision in controlling the thin-film thickness. The static drift ratios of two output electric signals are equal to or less than 7%/h, as well as the analog signal-to-noise ratios of reference or measurement paths are more than 500. The digital display sensitivity responding to reflectivity is higher, the linear regression factor of the digital display data is 0.979, and the display resolution of low reflectivity is equal to 0.02%. Compared with the conventional TFTM system, the uncertainty of monitoring signal in the new technology declines one order of magnitude, consequently, the drift ratio of monitoring signal is approximately equal to 0.

-Comparing general optical thin-film deposition systems, which present poor precision and automation level on monitoring film thickness, we proposed a new intelligent photoelectric-control-analysis coating system. The structure of the new system includes a four-light path photoelectric system matching with double-frequency modulation hardware equipment and a compound filteration-control system. The compound filterationcontrol system contains anti-disturbance circuit, analog circuits of multi-stage amplifier, symmetrical dual-lock-phase amplifier, digital division, anti-pulse-disturbance digital filter, linearization of digital display, algorithm of picking off singular data, and extremumjudgment algorithm. Experiments show that all functions of intelligent real-time monitoring film thickness are achieved. The physical characteristics, for example, the static and dynamic stabilities and the control thin-film thickness precision, are extremely increased. The resolution of digital display as per reflectivity is 0.02%. The duplication, i.e., standard deviation of monitoring thinfilm thickness, is less than 0.50%. The S/N approaches to 1500. The linearity of drift is very high, and the static drift ratio is close to 1.63%/h. In conclusion，the new system has advantages of the high control precision for thin-film thickness and the favorable static and dynamic stabilities.