The effect of sodium halide on aggregation behavior of four cationic silicone surfactants, Si3mamCl, Si4mamCl, Si4PyCl, and Si4minCl, in solution was investigated using surface tension and conductivity measurements. The ability of sodium halide (NaCl, NaBr, and NaI) to reduce critical micelle concentration (CMC) values was in the order NaI > NaBr > NaCl. However, the γCMC values of the cationic silicone surfactants, Si4mamCl, Si4PyCl and Si4minCl, in sodium halide solution are almost the same as those of the salt‐free system. The values of normalΔGm0 and normalΔGads0 are negative, indicating that the micellization process and adsorption of the four cationic silicone surfactants at the air‐solution interface are spontaneous.

No abstract