In this study the breakdown voltage for Ti/4H-SiC type Schottky diode with six guard rings and JTE layer has been calculated by mean of numerical simulations. It is established that increase of the n-type 4H-SiC epitaxial layer from 14 up to 20 μm and addition of JTE layer lead to increase of breakdown voltage value on ∼900 V in contrast to the same diode without JTE. The above-mentioned diode’s structure gives the possibility for designing and production of diode with higher breakdown voltage value up to 3 kV.

In this study the input, output and current gain characteristics of silicon n-p-n type medium power bipolar junction transistors KT242A91 made by the "GRUPPA KREMNY EL" in modern small-sized metalpolymeric package type (SOT-89) have been obtained. The SPICE model that allows simulating realistic transistor behaviour of n-p-n type transistor KT242A91 has been proposed. It is shown that established experimental characteristics for KT242A91 transistor correspond to similar transistor’s type characteristics.

No abstract

No abstract