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We present the noise performance of High Electron Mobility Transistors (HEMT) developed by CNRS/C2N laboratory. Various HEMT's gate geometries with 2 pF to 230 pF input capacitance have been studied at 4 K. A model for both voltage and current noises has been developed with frequency dependence up to 1 MHz. These HEMTs exhibit low dissipation, excellent noise performance and can advantageously replace traditional Si-JFETs for the readout of high impedance thermal sensor and semiconductor ionization cryogenic detectors. Our model predicts that cryogenic germanium detectors of 30 g with 10 eV heat and 20 eV ee baseline resolution are feasible if read out by HEMT-based amplifiers. Such resolution allows for high discrimination between nuclear and electron recoils at low threshold. This capability is of major interest for Coherent Elastic Neutrino Scattering and low-mass dark matter experiments such as Ricochet and EDELWEISS.