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The damage evolution in Bi2223 filaments and its influence on critical current was described by a Monte Carlo-shear lag simulation method. The experimentally observed zigzag crack propagation across aligned Bi2223 grains under tensile strain was effectively modelled by including transverse and longitudinal failure modes for individual grains. From the simulated stress-strain curve, the survival parameter (slope of the stress-strain curve normalized with respect to the original Young's modulus) was estimated with increasing applied strain. With this parameter combined with the strain sensitivity of the critical current, the measured change of critical current of the composite tape with applied strain could be described well.

The distribution of the local critical current and the n-value along the sample length and its relation to the overall critical current were studied experimentally and analytically for the bent multifilamentary Bi2223/Ag/Ag-Mg alloy superconducting composite tape. Then, based on the results, it was attempted to simulate on a computer the dependence of the critical current on the sample length. The main results are summarized as follows. The experimentally observed relation of the distributed local critical current and n-value to the overall critical current was described comprehensively with a simple voltage summation model, in which the sample was regarded as a one-dimensional series circuit. The sample length dependence of the critical current was reproduced on the computer by a Monte Carlo simulation incorporating the voltage summation model and the regression analysis results for the local critical current distribution and the relation of the n-value to the critical current.

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