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We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. We also present data on the susceptibility of parts to functional degradation resulting from total ionizing dose at low dose rates ( 0

Abstract--We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.

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Abstract-Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital, linear, and hybrid devices.Index Terms-Single Event Effects, spacecraft electronics, digital, linear bipolar, and hybrid devices.In order to meet the demands of reduced cost. higher performance and more rapid delivery schedules imposed by the space flight community, commercial and emerging technology devices have assumed a prominent role in meeting these needs. The importance of ground-based testing of such devices for susceptibility to single event effects (SEE) has assumed greater importance. The novel ways in which some of these devices are used also highlights the need for application specific testing to ensure their proper operation and ability to meet mission goals.