D-Pak package transistors of the raised heat dispersion capacity have a copper alloy crystal mount for maintenance of low thermal resistance. Various technologies of SMT soldering are connected to intensive heating, danger bursting transistor structure, penetration of moisture inside of the package and degradation transistor's characteristics. Influence constructive and technology factors on stability of transistors to thermal loadings up to 400 0 are investigated.
At present power DMOS transistors are regarded as one ofthe most prospective componentsfor many power-saving devices. When developing power DMOS transistors, which parameters are analogs ofIRL 640, "Transistor Factory " ofRPC "Integral " used the skills ofphysical and layout simulation and design of low-power LSI having N-channel MOS transistor structures. Based on this approach and using the developed original software, conducted was optimization ofparameters ofsolid-state structure ofpower DMOS transistors ofKP728E] type. In particular, minimized were the resistance values between the drain and source areas in the transistor "open " state, output andpass-by capacitances ofcell transistor structure when maintaining other parameters at the set level. Given are resistive and capacitance models ofa DMOS transistor. Resistance ofa conductive channel in an elementary cell ofa DMOS transistor was calculated as the sum ofcapacitances ofa solid-state structure, including herein the induced channel ofa horizontal N-MOS transistor, and the cell's capacitances are optimized taking into account SiO2 thickness in different parts ofthe structure.
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