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PurposeThe leaching of lead from electronic components in landfills to ground water is harmful to health and to the environment. Increasing concern over the use of lead in electronics manufacturing has led to legislation to restrict its use as a joining material. Consequently, significant recent research efforts have been geared to identification of suitable lead‐free solder pastes. Typically, lead‐free solder pastes contain a very active flux in an effort to improve wetting. These aggressive fluxes have the tendency to explode (or burst) and create flux spatter, causing many process problems with sensitive electronic components. The purpose of this paper is to propose solution procedures to minimize/eliminate these flux spatters, particularly, on gold fingers in memory modules when lead‐free solder pastes are used.Design/methodology/approachFour no‐clean, lead‐free Sn‐Ag‐Cu (SAC) alloy‐based solder pastes consisting of four different flux systems from three different vendors were evaluated. Two types of reflow profiles (linear and ramp‐soak‐ramp) were also evaluated. Experiments were also conducted to optimise the soak temperature and soak time to determine a broader process window for lead‐free volume production with minimal flux spatter on the contact fingers of memory modules. In order to validate our findings the recommended profile and paste was adopted in production. Additional experiments on a board with a different surface finish were also carried out to validate the recommendations.FindingsFlux spatter can be reduced/eliminated through proper selection of flux chemistry and reflow profile optimisation. The experimental study conducted indicates there is a reduction in the occurrence of flux spatter when a ramp‐soak‐ramp profile is used with lead‐free solder pastes.Originality/valueDemonstrates that flux spatter can be reduced/eliminated by carefully choosing a soak profile and appropriate flux chemistry.

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Fine pitch leadless components, such as Ball Grid Arrays (BGAs) and Chip-Scale Packages (CSPs), are increasingly used in modern day circuitry to aid miniaturization. Assembling these surface mount components using lead-free solder pastes has been a subject of interest for the past several years. Reworking a BGA is complicated as the solder joints are hidden underneath the component. The process window available for the rework process is very narrow and there are number of other critical factors, which complicate and affect the repeatability of the rework process. Consequently, the primary objective of this research endeavor is to develop a reliable and a repeatable process to rework lead-free fine pitch BGAs. The process steps to rework a BGA are component removal, site redressing, solder paste/flux deposition, component replacement and reflow. This experimental study evaluates a number of alternatives for several rework process steps during the course of developing a reliable and repeatable rework process. Two alternatives for site redressing namely, (i) copper wick with soldering iron, and (ii) vacuum de-soldering methods are evaluated. Similarly the application of solder paste versus gel flux is compared. A localized reflow method for replacing the component at the SRT machine is developed and it is compared with forced convection in reflow oven. The pros and cons of using the two reflow methods and the effect of multiple reflows on solder joint reliability is discussed in the paper. A reliability study was conducted on the samples and the results are presented to compare the various alternatives.

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