The amount of the measured room temperature thermal expansion coefficient of tetragonal strained layers grown lattice matched on the InP substrate used is about 30% greater the expected one for a cubic “relaxed” material. This issue has to be taken into account for the determination of the composition of the quarternary GaxIn1‐xAsyP1‐y layers from both X‐ray and photoluminescence data as well as for the estimation of the thermally created stress field of optoelectronic devices.
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