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This paper makes an analysis of the Software in the Loop (SiL) environment reliability for testing embedded system algorithms. The embedded system used during this analysis was developed around a C167CR microcontroller and based on a real-time (RT) operating system (OS). The main function of the control algorithm implemented into the embedded system is to control the speed of a DC motor. The embedded system software was wrapped into a SiL environment where the real-time operating system and the low level drivers where emulated. The obtained results where compared with the ones from Hardware in the Loop (HiL) testing system. Several aspects were followed during analysis: accuracy of the obtained results, proper functioning of the emulated RT OS, the possibility of using the same tools over product life cycle and implementation of automated.Index Terms-embedded system, Software in the Loop, testing, life cycle

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This paper presents some aspects of fault-tolerant design using hardware redundancy. The voter is the key element in N-Modular Redundant Design.Hardware voters are bit voters that compute a majority of n input bits. An m-out-of-n hardware bit voter is a circuit with n bit inputs, and 1 bit -output y, such that y=l if at least m-out-of-n inputs bits have the value 1. A hardware voter can be implemented with logic gates in CMOS VLSI technology. Designers are looking for optimal designs with respect to the following criteria: circuit complexity, number of logic levels, fan-in and fan-out, power dissipation, testability, or any combinations of the previous requirements in order to obtain high reliability for the voting circuits.A detailed reliability analysis, failure modes and effects analysis of voters at the transistor level is performed using CARE tools. CARE (Computer Aided Reliability Engineering) is a powerful software tool that can be used concurrently in the phases of R&D for complex reliability analyses of electronic circuits.The main goal of these analyses is to identify the best designs of voting circuits, in terms of reliability parameters and to identify the possible technological failures that can affect them.

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