Abstract:We report on a direct diode-pumped Ti:sapphire ultrafast regenerative amplifier laser system producing multi-μJ energies with a repetition rate from 50 to 250 kHz. By combining cryogenic cooling of Ti:sapphire with high brightness fiber-coupled 450nm laser diodes, we for the first time demonstrate a power-scalable CW-pumped architecture that can be directly applied to demanding ultrafast applications such as coherent high-harmonic EUV generation without any complex post-amplification pulse compression. Initial results promise a new era for Ti:sapphire amplifiers not only for ultrafast laser applications, but also for tunable CW sources. We discuss the unique challenges to implementation, as well as the solutions to these challenges. S. Schilt, and T. Südmeyer, "Green-diode-pumped femtosecond Ti:Sapphire laser with up to 450 mW average power," Opt.

High-intensity pulse-beams are ubiquitous in scientific investigations and industrial applications ranging from the generation of secondary radiation sources (e.g., high harmonic generation, electrons) to material processing (e.g., micromachining, laser-eye surgery). Crucially, pulse-beams can only be controlled to the degree to which they are characterized, necessitating sophisticated measurement techniques. We present a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure.

We present a phase retrieval algorithm for dispersion scan (d-scan), inspired by ptychography, which is capable of characterizing multiple mutually-incoherent ultrafast pulses (or modes) in a pulse train simultaneously from a single d-scan trace. In addition, a form of Newton’s method is employed as a solution to the square root problem commonly encountered in second harmonic pulse measurement techniques. Simulated and experimental phase retrievals of both single-mode and multi-mode d-scan traces are shown to demonstrate the accuracy and robustness of the root preserving ptychographic algorithm (RPPA).

Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, E ~ ( x , y , z , ω ) , can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, E ~ ( x , y , ω ) , from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses.

We demonstrate a novel dispersion scan algorithm using grating dispersion. We also propose using the intrinsic dispersion of temporally focused laser pulses to characterize the pulse structure by scanning a nonlinear crystal through focus.