This paper discusses the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales and gage blocks to a future of atom-based dimensional standards. Current capabilities include dimensional measurements over a range of fourteen orders of magnitude. Uncertainties of measurements on different types of material artifacts range down to 7×10−8 m at 1 m and 8 picometers (pm) at 300 pm. Current work deals with a broad range of areas of dimensional metrology. These include: large-scale coordinate systems; complex form; microform; surface finish; two-dimensional grids; optical, scanning-electron, atomic-force, and scanning-tunneling microscopies; atomic-scale displacement; and atom-based artifacts.

Resonances observed in the polarization ratio of light scattered at 90 degrees from single optically levitated evaporating droplets are shown to provide a means for continuous high-resolution monitoring of droplet size. Due to the distinctive character of the individual features in the polarization ratio, each experimentally measured feature could be clearly identified with a specific calculated one. For evaporating droplets of glycerol from 6.6 to 11.5 microm in diameter, the sharp features which appeared in the calculations at ~0.03-microm intervals allowed measurement of droplet diameter to a resolution of 0.003 microm.

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This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI (International System of Units) unit of length in dimensional measurements by manufacturers without direct recourse to a National Metrology Institute (NMI) for dimensional calibrations.